Wang Laung-Terng Ed. <br/><br/>
VLSI test principles  and architecture  design for testability. 

 - Amsterdam  Morgan Kaufmann        2006 
 - xxiii,777p  cm. 
<br/><br/><label>Standard No.: </label>77051 
<br/><br/><label>Source: </label> Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/>VLSI
<br/><br/><label>Dewey Class. No.: </label>D651:81, P6