Reifenberger Ronald <br/><br/>
Fundamentals of atomic force microscopy 

 - Hackensack  World Scientific        2016 
 - xv, 324p. ill. 
<br/><br/> Index 319-324p. 
<br/><br/><label>ISBN: </label>9789814630351 (pbk) SL01599900 
<br/><br/><label>Standard No.: </label>194976 
<br/><br/><label>Source: </label> 3414, 04/12/2015, Ashutosh Technical Books  Textual 
<br/><br/><label>Subjects--Topical Terms: </label><br/> AFM system components<br/> Experimental calibrations<br/>Contact mode AFM
<br/><br/><label>Dewey Class. No.: </label>C9B3, Q6 TC