Bhagavannarayana Godavarthi <br/><br/>
High resolution x-ray diffraction study of as grown and BF /Sub 2/ implanted silicon single crystals 

 - Delhi  University of Delhi India    1994 
<br/><br/><label>Standard No.: </label>309 
<br/><br/><label>Source: </label> Theses 
<br/><br/><label>Subjects--Topical Terms: </label><br/> PHYSICS<br/>X-RAYS