Dashtiani Masoud <br/><br/>
Effect of excess copper and indium on the electrical transport and x-ray diffraction studies in polycrystalline Cu In Te2 thin films 

 -  1969 
<br/><br/><label>Standard No.: </label>832 
<br/><br/><label>Source: </label> Theses 
<br/><br/><label>Subjects--Topical Terms: </label><br/>PHYSICS