Ray U. C. <br/><br/>
Effect of built-in drift fields emmitter recombinations, back surface recombinations and high injection on open circuit voltage decay 

 -  1988 
<br/><br/><label>Standard No.: </label>7467 
<br/><br/><label>Source: </label> Theses 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ELECTRICAL ENGINEERING