Pratap Yogesh Au. <br/><br/>
Modeling, simulation and characterization of gate-all-around junctionless transistor-reliability and digital applications 

 -  2015 
 - vii,187p.  p.  cm. 
<br/><br/><label>Standard No.: </label>28639 
<br/><br/><label>Source: </label> Theses 
<br/><br/><label>Subjects--Topical Terms: </label><br/> DIGITAL ELECTRONICS<br/>ELECTRONIC SCIENCE