<![CDATA[Delhi University Library System Search for 'su:{ Electron microscopy analysis}']]>

<![CDATA[Delhi University Library System Search for 'su:{ Electron microscopy analysis}']]> /cgi-bin/koha/opac-search.pl?idx=&q=su%3A%7B%20Electron%20microscopy%20analysis%7D&sort_by=title_asc&format=rss 26 0 50 Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks by David H Krinsley and REFs ISBN:0521453461 (hbd) /cgi-bin/koha/opac-detail.pl?biblionumber=67354 ]]> By Krinsley David H^eand REFs.
Cambridge Cambridge University Press 1998 .
ix, 193p , Bibliography 173-190p; Index 191-193p; ^n23/CSL/H/98-99/6752^d1998-11-23^mPurchase 0521453461 (hbd)

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=67354 Clastic particles: Scanning electron microscopy and shape analysis of sedimentary and volcanic clasts ISBN: /cgi-bin/koha/opac-detail.pl?biblionumber=71631 By Marshall John R Ed..
New York Van nostrand reinhold 1987 .
346p. cm..

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=71631 Electron microprobe analysis and scanning electron microscopy in geology by S J B Reed ISBN:0521483506 (pbk) /cgi-bin/koha/opac-detail.pl?biblionumber=49820 ]]> By Reed S J B.
Cambridge Cambridge University Press 1996 .
xiv,201p , Bibliographical referenses 188-198p; Index 199-201p; ^n23/CSL/H/96-97/3667^d1996-11-05^mPurchase; ; 96-97/213^b1996-11-19^c198/96^d1996-11-14^eSumee Books; ; 1996-11-28^bSB^c1997-08-26^r1997-09-30 0521483506 (pbk)

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=49820 Electron microprobe analysis ans scanning electron microscopy in geography ISBN:SL01173061 /cgi-bin/koha/opac-detail.pl?biblionumber=5019 By Reed S J b.
SL01173061

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=5019 Electron microscopy and analysis ISBN:9780748409688 (pbk) | SL01560228 /cgi-bin/koha/opac-detail.pl?biblionumber=9104 By Goodhew Peter J; Humphreys John; Beanland Richard.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. 9780748409688 (pbk) | SL01560228

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=9104 Electron microscopy and analysis ISBN:9780748409688 (pbk) | SL01560227 /cgi-bin/koha/opac-detail.pl?biblionumber=9103 By Goodhew Peter J; Humphreys John; Beanland Richard.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. 9780748409688 (pbk) | SL01560227

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=9103 Electron microscopy and analysis ISBN:9780748409688 (pbk) | SL01560226 /cgi-bin/koha/opac-detail.pl?biblionumber=9102 By Goodhew Peter J; Humphreys John; Beanland Richard.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. 9780748409688 (pbk) | SL01560226

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=9102 Electron microscopy and analysis ISBN:9780748409688 (pbk) | SL01560225 /cgi-bin/koha/opac-detail.pl?biblionumber=9101 By Goodhew Peter J; Humphreys John; Beanland Richard.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. 9780748409688 (pbk) | SL01560225

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=9101 Electron microscopy and analysis ISBN:9780748409688 (pbk) | SL01560224 /cgi-bin/koha/opac-detail.pl?biblionumber=9100 By Goodhew Peter J; Humphreys John; Beanland Richard.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. 9780748409688 (pbk) | SL01560224

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=9100 Electron microscopy and analysis Humphreys John Beanland Richard ISBN:9780748409688 (pbk) /cgi-bin/koha/opac-detail.pl?biblionumber=1213565 By Goodhew Peter J.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. cm..
9780748409688 (pbk)

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1213565 Electron microscopy and analysis Humphreys John Beanland Richard ISBN:9780748409688 (pbk) /cgi-bin/koha/opac-detail.pl?biblionumber=1213564 By Goodhew Peter J.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. cm..
9780748409688 (pbk)

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1213564 Electron microscopy and analysis Humphreys John Beanland Richard ISBN:9780748409688 (pbk) /cgi-bin/koha/opac-detail.pl?biblionumber=1213563 By Goodhew Peter J.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. cm..
9780748409688 (pbk)

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1213563 Electron microscopy and analysis Humphreys John Beanland Richard ISBN:9780748409688 (pbk) /cgi-bin/koha/opac-detail.pl?biblionumber=1213562 By Goodhew Peter J.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. cm..
9780748409688 (pbk)

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1213562 Electron microscopy and analysis Humphreys John Beanland Richard ISBN:9780748409688 (pbk) /cgi-bin/koha/opac-detail.pl?biblionumber=1213561 By Goodhew Peter J.
London Taylor & Francis 2001 .
xii,251p. ill. , Include bibliographical references.; Index 243-251p. cm..
9780748409688 (pbk)

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1213561 Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997 ISBN:9781003063056 /cgi-bin/koha/opac-detail.pl?biblionumber=1811498 ]]> By John M. Rodenburg.
Taylor and Francis 1997 9781003063056

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1811498 Electron Microscopy and Analysis 2001 ISBN:9780429175527 /cgi-bin/koha/opac-detail.pl?biblionumber=1798660 ]]> By M. Aindow; C. J. Kiely.
Taylor and Francis 2001 9780429175527

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1798660 Electron Microscopy and Analysis 2003 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003 ISBN:9780429076602 /cgi-bin/koha/opac-detail.pl?biblionumber=1789822 ]]> By S McVitie; D McComb.
Taylor and Francis 2004 9780429076602

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1789822 Electron probe microanalysis ISBN: /cgi-bin/koha/opac-detail.pl?biblionumber=19263 By Birks L S.
New York Wiley Interscience 1971 .
ix,190p. cm..

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=19263 Image analysis enhancement and interpretation ISBN: /cgi-bin/koha/opac-detail.pl?biblionumber=26477 By Misell D L.
Amsterdam Noerth Holland 1978 .
xv,305p. , Appendix 293-296p cm..

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=26477 John Humphreys; Peter J. Goodhew; John Humphreys ISBN:9780429176258 /cgi-bin/koha/opac-detail.pl?biblionumber=1610712 ]]> By Electron Microscopy and Analysis.
Taylor and Francis 2000 9780429176258

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1610712 Physical aspects of electron microscopy and micro beam analysis ISBN: /cgi-bin/koha/opac-detail.pl?biblionumber=24265 By Siegel Benjamin M Ed..
New York John wiley 1975 .
xiii,474p. cm..

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=24265 Proceeding on developments in electron microscopy and analysis ISBN: /cgi-bin/koha/opac-detail.pl?biblionumber=39831 By Venables J A Ed..
London Academic Press 1976 .
xxviii,537p. cm..

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=39831 Proceeding on electron microscopy and analysis ISBN: /cgi-bin/koha/opac-detail.pl?biblionumber=28256 By Doig P Ed..
Bristol Institute of Physics 1984 .
xviii, 530p. cm..

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=28256 Proceeding on electron microscopy and analysis ISBN: /cgi-bin/koha/opac-detail.pl?biblionumber=17982 By Brown L M Ed..
Bristol Institute of Physics 1987 .
361p. cm..

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=17982 Reflection Electron Microscopy and Spectroscopy for Surface Analysis ISBN:9780511525254 /cgi-bin/koha/opac-detail.pl?biblionumber=1709993 ]]> By Wang.
Cambridge University Press 2010 9780511525254

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]]> /cgi-bin/koha/opac-detail.pl?biblionumber=1709993 Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis ISBN:9781848167902 /cgi-bin/koha/opac-detail.pl?biblionumber=1542707 ]]> By Nagoya Univ, Japan.
ICP | World Scientific 2014 9781848167902

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