<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Delhi University Library System Search for 'su:{ Engineering metrology}']]> </title> <!-- prettier-ignore-start --> <link> /cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Engineering%20metrology%7D&#38;sort_by=title_asc&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Engineering%20metrology%7D&#38;sort_by=title_asc&#38;format=rss" /> <description> <![CDATA[ Search results for 'su:{ Engineering metrology}' at Delhi University Library System]]> </description> <opensearch:totalResults>9</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Engineering%20metrology%7D&#38;sort_by=title_asc&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="idx%3D%26q%3Dsu%253A%257B%2520Engineering%2520metrology%257D" startPage="" /> <item> <title> Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method </title> <dc:identifier>ISBN:9781119818984</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1550267</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1119818982.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pierre-Richard Dahoo.<br /> Wiley 2021 9781119818984 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1550267">Place hold on <em>Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1550267</guid> </item> <item> <title> Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1719945</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Dahoo.<br /> IEEE </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1719945">Place hold on <em>Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1719945</guid> </item> <item> <title> Course in workshop technology </title> <dc:identifier>ISBN:SL00859528</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=7860</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Raghuwanshi B S.<br /> Delhi Dhanpat rai 2003 .<br /> xvi,736p , Index 692-709p. SL00859528 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=7860">Place hold on <em>Course in workshop technology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=7860</guid> </item> <item> <title> Course in workshop technology </title> <dc:identifier>ISBN:SL00859519</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=7859</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Raghuwanshi B S.<br /> Delhi Dhanpat rai .<br /> xxiv,1001p. , Bibliography 977-979p.; Appendices 980-1001p. SL00859519 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=7859">Place hold on <em>Course in workshop technology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=7859</guid> </item> <item> <title> Engineering metrology </title> <dc:identifier>ISBN:817409153X (pbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=27279</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/817409153X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jain R K.<br /> Delhi Khanna Publishers 2005 .<br /> xvi,1204p. , Appendix-I 1182-1186p; Index 1187-1204p cm..<br /> 817409153X (pbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=27279">Place hold on <em>Engineering metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=27279</guid> </item> <item> <title> Engineering metrology </title> <dc:identifier>ISBN:817409153X (pbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=27278</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/817409153X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jain R K.<br /> Delhi Khanna Publishers 2005 .<br /> xvi,1204p. , Appendix-I 1182-1186p; Index 1187-1204p cm..<br /> 817409153X (pbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=27278">Place hold on <em>Engineering metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=27278</guid> </item> <item> <title> Engineering Metrology for Pedestrian Falls Prevention and Protection </title> <dc:identifier>ISBN:9783030957469</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1662486</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3030957462.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By In-Ju Kim.<br /> Springer 2022 9783030957469 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1662486">Place hold on <em>Engineering Metrology for Pedestrian Falls Prevention and Protection</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1662486</guid> </item> <item> <title> Metrology and Instrumentation - Practical Applications for Engineering and Manufacturing </title> <dc:identifier>ISBN:9781119721789</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1552221</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1119721784.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Samir Mekid.<br /> Wiley 2021 9781119721789 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1552221">Place hold on <em>Metrology and Instrumentation - Practical Applications for Engineering and Manufacturing</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1552221</guid> </item> <item> <title> Proceeding on engineering dimensional metrology </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=38424</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> 1954 .<br /> p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=38424">Place hold on <em>Proceeding on engineering dimensional metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=38424</guid> </item> </channel> </rss>
