<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Delhi University Library System Search for 'su:{ Metrology}']]> </title> <!-- prettier-ignore-start --> <link> /cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Metrology%7D&#38;sort_by=title_asc&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Metrology%7D&#38;sort_by=title_asc&#38;format=rss" /> <description> <![CDATA[ Search results for 'su:{ Metrology}' at Delhi University Library System]]> </description> <opensearch:totalResults>83</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Metrology%7D&#38;sort_by=title_asc&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="idx%3D%26q%3Dsu%253A%257B%2520Metrology%257D" startPage="" /> <item> <title> Advanced Mathematical and Computational Tools in Metrology and Testing Ix </title> <dc:identifier>ISBN:9789814397957</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1543376</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9814397954.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pavese Franco Et Al.<br /> World Scientific | WSPC 2012 9789814397957 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1543376">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology and Testing Ix</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1543376</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology and Testing Viii </title> <dc:identifier>ISBN:9789812839527</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1544308</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812839526.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pavese Franco Et Al.<br /> World Scientific | WSPC 2009 9789812839527 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1544308">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology and Testing Viii</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1544308</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology and Testing X </title> <dc:identifier>ISBN:9789814678629</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1542453</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9814678627.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pavese Franco Et Al.<br /> World Scientific | WSPC 2015 9789814678629 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1542453">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology and Testing X</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1542453</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology and Testing Xi </title> <dc:identifier>ISBN:9789813274303</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1541139</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9813274301.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Forbes Alistair Et Al.<br /> World Scientific | WSPC 2018 9789813274303 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1541139">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology and Testing Xi</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1541139</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology and Testing Xii </title> <dc:identifier>ISBN:9789811242380</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1539998</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9811242380.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pavese Franco Et Al.<br /> World Scientific | WSPC 2022 9789811242380 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1539998">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology and Testing Xii</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1539998</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology Iv </title> <dc:identifier>ISBN:9789812793836</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1546829</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812793836.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ciarlini P Et Al.<br /> World Scientific | WSPC 2000 9789812793836 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1546829">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology Iv</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1546829</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology V </title> <dc:identifier>ISBN:9789812811684</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1546518</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812811680.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ciarlini P Et Al.<br /> World Scientific | WSPC 2001 9789812811684 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1546518">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology V</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1546518</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology Vi </title> <dc:identifier>ISBN:9789812702647</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1545645</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812702644.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ciarlini Patrizia Et Al.<br /> World Scientific | WSPC 2004 9789812702647 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1545645">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology Vi</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1545645</guid> </item> <item> <title> Advanced Mathematical and Computational Tools in Metrology Vii </title> <dc:identifier>ISBN:9789812774187</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1545204</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812774181.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ciarlini Patrizia Et Al.<br /> World Scientific | WSPC 2006 9789812774187 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1545204">Place hold on <em>Advanced Mathematical and Computational Tools in Metrology Vii</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1545204</guid> </item> <item> <title> Advanced Mathematical Tools in Metrology - Proceedings of the International Workshop </title> <dc:identifier>ISBN:9789814534383</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1548422</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9814534382.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pavese F Et Al.<br /> World Scientific | WSPC 1994 9789814534383 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1548422">Place hold on <em>Advanced Mathematical Tools in Metrology - Proceedings of the International Workshop</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1548422</guid> </item> <item> <title> Advanced Mathematical Tools in Metrology Iii </title> <dc:identifier>ISBN:9789814530293</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1547495</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9814530298.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Cnr, Istituto Di Metrologia Torino, Italy.<br /> World Scientific | WSPC 1997 9789814530293 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1547495">Place hold on <em>Advanced Mathematical Tools in Metrology Iii</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1547495</guid> </item> <item> <title> Advanced Metrology </title> <dc:identifier>ISBN:9780128218150</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1494547</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0128218150.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jiang, X..<br /> Academic Press Elsevier 2020 9780128218150 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1494547">Place hold on <em>Advanced Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1494547</guid> </item> <item> <title> Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1719944</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Dahoo.<br /> IEEE </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1719944">Place hold on <em>Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1719944</guid> </item> <item> <title> Applications and Metrology at Nanometer-Scale 1 - Smart Materials, Electromagnetic Waves and Uncertainties </title> <dc:identifier>ISBN:9781119808244</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1550266</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1119808243.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pierre-Richard Dahoo.<br /> Wiley 2021 9781119808244 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1550266">Place hold on <em>Applications and Metrology at Nanometer-Scale 1 - Smart Materials, Electromagnetic Waves and Uncertainties</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1550266</guid> </item> <item> <title> Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method </title> <dc:identifier>ISBN:9781119818984</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1550267</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1119818982.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Pierre-Richard Dahoo.<br /> Wiley 2021 9781119818984 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1550267">Place hold on <em>Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1550267</guid> </item> <item> <title> Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1719945</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Dahoo.<br /> IEEE </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1719945">Place hold on <em>Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1719945</guid> </item> <item> <title> Basic Metrology for ISO 9000 Certification </title> <dc:identifier>ISBN:9780080499833</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1794930</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/008049983X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By G. M. S. de Silva.<br /> Taylor and Francis 2002 9780080499833 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1794930">Place hold on <em>Basic Metrology for ISO 9000 Certification</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1794930</guid> </item> <item> <title> Characterization, Testing, Measurement, and Metrology </title> <dc:identifier>ISBN:9780429298073</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1743582</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0429298072.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Chander Prakash; Sunpreet Singh; J. Paulo Davim.<br /> Taylor and Francis 2020 9780429298073 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1743582">Place hold on <em>Characterization, Testing, Measurement, and Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1743582</guid> </item> <item> <title> Coinage and metrology of the sultan of Delhi incorporating a catologue of the coins in the author's cabinet now in the Delhi Museum </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=224426</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Wright H Nelson.<br /> NA NA 1936 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=224426">Place hold on <em>Coinage and metrology of the sultan of Delhi incorporating a catologue of the coins in the author's cabinet now in the Delhi Museum</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=224426</guid> </item> <item> <title> Coinage and metrology of the sultan of Delhi incorporating a catologue of the coins in the author's cabinet now in the Delhi Museum </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=224425</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Wright H Nelson.<br /> NA NA 1936 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=224425">Place hold on <em>Coinage and metrology of the sultan of Delhi incorporating a catologue of the coins in the author's cabinet now in the Delhi Museum</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=224425</guid> </item> <item> <title> Coinage and metrology of the sultans of Dehli </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=785469</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Wright H Nelson.<br /> New Delhi Oriental Books 1974 .<br /> xx,424p cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=785469">Place hold on <em>Coinage and metrology of the sultans of Dehli</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=785469</guid> </item> <item> <title> Course in workshop technology </title> <dc:identifier>ISBN:SL00859528</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=7860</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Raghuwanshi B S.<br /> Delhi Dhanpat rai 2003 .<br /> xvi,736p , Index 692-709p. SL00859528 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=7860">Place hold on <em>Course in workshop technology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=7860</guid> </item> <item> <title> Course in workshop technology </title> <dc:identifier>ISBN:SL00859519</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=7859</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Raghuwanshi B S.<br /> Delhi Dhanpat rai .<br /> xxiv,1001p. , Bibliography 977-979p.; Appendices 980-1001p. SL00859519 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=7859">Place hold on <em>Course in workshop technology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=7859</guid> </item> <item> <title> Dimensional Metrology </title> <dc:identifier>ISBN:9780367821746</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1728892</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0367821745.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Han Haitjema; Richard Leach.<br /> Taylor and Francis 2025 9780367821746 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1728892">Place hold on <em>Dimensional Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1728892</guid> </item> <item> <title> Encyclopaedia of Historical Metrology, Weights, and Measures </title> <dc:identifier>ISBN:9783319666914</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1630229</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3319666916.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jan Gyllenbok.<br /> Springer 2018 9783319666914 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1630229">Place hold on <em>Encyclopaedia of Historical Metrology, Weights, and Measures</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1630229</guid> </item> <item> <title> Encyclopaedia of Historical Metrology, Weights, and Measures </title> <dc:identifier>ISBN:9783319667126</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1629976</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3319667122.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jan Gyllenbok.<br /> Springer 2018 9783319667126 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1629976">Place hold on <em>Encyclopaedia of Historical Metrology, Weights, and Measures</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1629976</guid> </item> <item> <title> Encyclopaedia of Historical Metrology, Weights, and Measures </title> <dc:identifier>ISBN:9783319575988</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1629961</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3319575988.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jan Gyllenbok.<br /> Springer 2018 9783319575988 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1629961">Place hold on <em>Encyclopaedia of Historical Metrology, Weights, and Measures</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1629961</guid> </item> <item> <title> Engineering metrology </title> <dc:identifier>ISBN:817409153X (pbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=27279</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/817409153X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jain R K.<br /> Delhi Khanna Publishers 2005 .<br /> xvi,1204p. , Appendix-I 1182-1186p; Index 1187-1204p cm..<br /> 817409153X (pbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=27279">Place hold on <em>Engineering metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=27279</guid> </item> <item> <title> Engineering metrology </title> <dc:identifier>ISBN:817409153X (pbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=27278</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/817409153X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jain R K.<br /> Delhi Khanna Publishers 2005 .<br /> xvi,1204p. , Appendix-I 1182-1186p; Index 1187-1204p cm..<br /> 817409153X (pbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=27278">Place hold on <em>Engineering metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=27278</guid> </item> <item> <title> Engineering Metrology for Pedestrian Falls Prevention and Protection </title> <dc:identifier>ISBN:9783030957469</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1662486</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3030957462.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By In-Ju Kim.<br /> Springer 2022 9783030957469 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1662486">Place hold on <em>Engineering Metrology for Pedestrian Falls Prevention and Protection</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1662486</guid> </item> <item> <title> Forensic Metrology </title> <dc:identifier>ISBN:9783031146190</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1666957</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3031146190.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Alessandro Ferrero, Veronica Scotti.<br /> Springer 2022 9783031146190 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1666957">Place hold on <em>Forensic Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1666957</guid> </item> <item> <title> Frequency Standards and Metrology - Proceedings of the 7Th Symposium </title> <dc:identifier>ISBN:9789812838223</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1544270</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812838228.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Maleki Lute.<br /> World Scientific | WSPC 2009 9789812838223 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1544270">Place hold on <em>Frequency Standards and Metrology - Proceedings of the 7Th Symposium</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1544270</guid> </item> <item> <title> Frequency Standards and Metrology - Proceedings of the Fifth Symposium </title> <dc:identifier>ISBN:9789814531559</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1547851</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9814531553.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Bergquist James C.<br /> World Scientific | WSPC 1996 9789814531559 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1547851">Place hold on <em>Frequency Standards and Metrology - Proceedings of the Fifth Symposium</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1547851</guid> </item> <item> <title> Frequency Standards and Metrology, Procs of the 6Th Symposium </title> <dc:identifier>ISBN:9789812777713</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1546220</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812777717.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Gill P.<br /> World Scientific | WSPC 2002 9789812777713 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1546220">Place hold on <em>Frequency Standards and Metrology, Procs of the 6Th Symposium</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1546220</guid> </item> <item> <title> Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1720046</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Servin.<br /> IEEE </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1720046">Place hold on <em>Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1720046</guid> </item> <item> <title> Graphene nanoelectronics Metrology,synthesis,properties and applications. </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=790285</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Raza Hassan Ed..<br /> Berlin Springer 2012 .<br /> xxiv,598p cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=790285">Place hold on <em>Graphene nanoelectronics </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=790285</guid> </item> <item> <title> Graphene nanoelectronics : Metrology, syenthesis, properties and applications </title> <dc:identifier>ISBN:9783662601587 (pbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1211461</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/3662601583.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Raza Hassan Ed..<br /> Berlin Springer 2012 .<br /> xxiii, 598p. ill. , Include references; Index 587-598p. cm..<br /> 9783662601587 (pbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1211461">Place hold on <em>Graphene nanoelectronics : Metrology, syenthesis, properties and applications</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1211461</guid> </item> <item> <title> Handbook of 3D Machine Vision Optical Metrology and Imaging </title> <dc:identifier>ISBN:9780429065774</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1758177</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0429065779.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Song Zhang.<br /> Taylor and Francis 2013 9780429065774 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1758177">Place hold on <em>Handbook of 3D Machine Vision</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1758177</guid> </item> <item> <title> Handbook of industrial metrology </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1040966</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By A.S.T.M.E.<br /> 1967 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1040966">Place hold on <em>Handbook of industrial metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1040966</guid> </item> <item> <title> Handbook of industrial metrology </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=31227</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Greve John W. Ed..<br /> 1967 .<br /> p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=31227">Place hold on <em>Handbook of industrial metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=31227</guid> </item> <item> <title> Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication (Volume Four) </title> <dc:identifier>ISBN:9781003130123</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1742678</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1003130127.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Chunlei Guo; Chandra Subhash Singh.<br /> Taylor and Francis 2021 9781003130123 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1742678">Place hold on <em>Handbook of Laser Technology and Applications</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1742678</guid> </item> <item> <title> Handbook of Optical Dimensional Metrology </title> <dc:identifier>ISBN:9780429064739</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1758134</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/042906473X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Kevin Harding.<br /> Taylor and Francis 2013 9780429064739 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1758134">Place hold on <em>Handbook of Optical Dimensional Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1758134</guid> </item> <item> <title> Handbook of Optical Metrology Principles and Applications, Second Edition </title> <dc:identifier>ISBN:9781315215952</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1749576</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1315215950.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Toru Yoshizawa.<br /> Taylor and Francis 2015 9781315215952 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1749576">Place hold on <em>Handbook of Optical Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1749576</guid> </item> <item> <title> Handbook of optical metrology:principles and applications </title> <dc:identifier>ISBN:9780849337604 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1210347</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0849337607.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Yoshizawa Toru Ed..<br /> Boca Raton CRC Press 2009 .<br /> xiii, 730p. , Includes bibliographical references.; Index 715- 730p. cm..<br /> 9780849337604 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1210347">Place hold on <em>Handbook of optical metrology:principles and applications</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1210347</guid> </item> <item> <title> Handbook of Optical Sensors </title> <dc:identifier>ISBN:9781439866856 </dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=6573</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1439866856.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> Boca: Raton CRC, 2015 .<br /> xviii, 699p. , Index 685-699p. 9781439866856 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=6573">Place hold on <em>Handbook of Optical Sensors</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=6573</guid> </item> <item> <title> Handbook of Silicon Semiconductor Metrology </title> <dc:identifier>ISBN:9780429207655</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1798561</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0429207654.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Alain C. Diebold.<br /> Taylor and Francis 2001 9780429207655 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1798561">Place hold on <em>Handbook of Silicon Semiconductor Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1798561</guid> </item> <item> <title> Handbook of Surface Metrology </title> <dc:identifier>ISBN:9780203752609</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1817097</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0203752600.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By David J. Whitehouse.<br /> Taylor and Francis 1994 9780203752609 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1817097">Place hold on <em>Handbook of Surface Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1817097</guid> </item> <item> <title> High Definition Metrology Based Surface Quality Control and Applications </title> <dc:identifier>ISBN:9789811502798</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1642424</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/981150279X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Shichang Du, Lifeng Xi.<br /> Springer 2019 9789811502798 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1642424">Place hold on <em>High Definition Metrology Based Surface Quality Control and Applications</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1642424</guid> </item> <item> <title> High-Productivity Drilling Tools Materials, Metrology, and Failure Analysis </title> <dc:identifier>ISBN:9781003263319</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1734401</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1003263313.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Viktor P. Astakhov.<br /> Taylor and Francis 2024 9781003263319 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1734401">Place hold on <em>High-Productivity Drilling Tools</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1734401</guid> </item> <item> <title> Introduction to Optical Metrology </title> <dc:identifier>ISBN:9781315215228</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1747325</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1315215225.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Rajpal S. Sirohi.<br /> Taylor and Francis 2016 9781315215228 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1747325">Place hold on <em>Introduction to Optical Metrology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1747325</guid> </item> </channel> </rss>
