<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[Delhi University Library System Search for 'su:{ Quality reliability}']]> </title> <!-- prettier-ignore-start --> <link> /cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Quality%20reliability%7D&#38;sort_by=title_asc&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Quality%20reliability%7D&#38;sort_by=title_asc&#38;format=rss" /> <description> <![CDATA[ Search results for 'su:{ Quality reliability}' at Delhi University Library System]]> </description> <opensearch:totalResults>127</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?idx=&#38;q=su%3A%7B%20Quality%20reliability%7D&#38;sort_by=title_asc&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="idx%3D%26q%3Dsu%253A%257B%2520Quality%2520reliability%257D" startPage="" /> <item> <title> Accelerated quality and reliability solutions </title> <dc:identifier>ISBN:0080449247 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=30236</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0080449247.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Klyatis Lev M.<br /> Amsterdam Elsevier Inc, 2006 .<br /> xxv, 489p. , Index 482-489p. cm..<br /> 0080449247 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=30236">Place hold on <em>Accelerated quality and reliability solutions</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=30236</guid> </item> <item> <title> Accelerated Reliability and Durability Testing Technology </title> <dc:identifier>ISBN:9780470454657 </dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=13429</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470454652.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By KLYATIS, L.M..<br /> New Jersey : Wiley , 2012 .<br /> xviii,414p. , Included Glossary of terms and definitions 375-392p.; References 393-406p.; Index 407-411p. 9780470454657 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=13429">Place hold on <em>Accelerated Reliability and Durability Testing Technology</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=13429</guid> </item> <item> <title> Advances in stochastic models for reliability, quality and safety </title> <dc:identifier>ISBN:0817640495 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=39975</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0817640495.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Kahle Waltraud Ed.<br /> Boston Birkhauser 1998 .<br /> xxvii,382p , Includes bibliographical references; Appendix 378p 0817640495 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=39975">Place hold on <em>Advances in stochastic models for reliability, quality and safety</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=39975</guid> </item> <item> <title> Appiled reliability </title> <dc:identifier>ISBN:9781584884668 (hbk) | SL01536500</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=6381</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1584884665.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Tobias Paul A; Trindade David C.<br /> Boca Raton CRC 2012 .<br /> xxxvi; 564p. , References 551-556p.; Index 557-564p. 9781584884668 (hbk) | SL01536500 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=6381">Place hold on <em>Appiled reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=6381</guid> </item> <item> <title> Applied reliability and quality Fundamentals, methods and procedures </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=770107</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Dhillon B S.<br /> London Springer 2007 .<br /> xiv,246p cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=770107">Place hold on <em>Applied reliability and quality</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=770107</guid> </item> <item> <title> Applied reliability and quality Fundamentals, methods and procedures </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=770106</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Dhillon B S.<br /> London Springer 2007 .<br /> xiv,246p cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=770106">Place hold on <em>Applied reliability and quality</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=770106</guid> </item> <item> <title> Applied reliability and quality: Fundamentals, methods and procedures </title> <dc:identifier>ISBN:9781846284977 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=25119</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/184628497X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Dhillon BS.<br /> London Springer-Verlag 2007 .<br /> xiv,246p. ill. , Includes bibliographical references; Appendix 189-239p; Index 243-246p cm..<br /> 9781846284977 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=25119">Place hold on <em>Applied reliability and quality: Fundamentals, methods and procedures</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=25119</guid> </item> <item> <title> Applied Reliability, Usability, and Quality for Engineers </title> <dc:identifier>ISBN:9781003298571</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1741516</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1003298575.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By B.S. Dhillon.<br /> Taylor and Francis 2022 9781003298571 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1741516">Place hold on <em>Applied Reliability, Usability, and Quality for Engineers</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1741516</guid> </item> <item> <title> Applying TQM to product design and development </title> <dc:identifier>ISBN:0824796772 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=45215</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0824796772.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Moss Marvin A.<br /> New York Marcel Dekker, Inc 1996 .<br /> xvi,412p 0824796772 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=45215">Place hold on <em>Applying TQM to product design and development</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=45215</guid> </item> <item> <title> Assurance sciences An introduction to quality control and reliability </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=822749</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Halpern Siegmund.<br /> 1978 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=822749">Place hold on <em>Assurance sciences </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=822749</guid> </item> <item> <title> Axiomatoic quality: Integrating axiomatic design with six-sigma,reliability, and quality engineering </title> <dc:identifier>ISBN:047168273X (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=42678</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/047168273X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By EL-Haik Basem Said.<br /> New Jersey John wiley and Sons 2005 .<br /> xx, 285p. , Bibliographical reference 273-280p; Index 281-285p cm..<br /> 047168273X (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=42678">Place hold on <em>Axiomatoic quality: Integrating axiomatic design with six-sigma,reliability, and quality engineering</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=42678</guid> </item> <item> <title> Complex system reliability:multichannel systems with imperfect fault coverage </title> <dc:identifier>ISBN:9781849964135 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=23453</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1849964130.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Myers Albert.<br /> London Springer 2010 .<br /> xiii, 238p. , Includes bibliographical references.; Appendices A-E, 195-234p.; Index 235-238p. cm..<br /> 9781849964135 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=23453">Place hold on <em>Complex system reliability:multichannel systems with imperfect fault coverage</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=23453</guid> </item> <item> <title> Computational methods for reliability and risk analysis </title> <dc:identifier>ISBN:9789812839015 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=29384</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812839011.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Zio Enrico.<br /> New Jersey World Scientific 2009 .<br /> xxii, 340p. , Includes bibliographical references.; References 335-338p.; Appendix 339-340p. cm..<br /> 9789812839015 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=29384">Place hold on <em>Computational methods for reliability and risk analysis</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=29384</guid> </item> <item> <title> Computational methods for reliability and risk analysis. </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=788013</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Zio Enrico.<br /> New Jersey World Scientific 2009 .<br /> xxii,340p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=788013">Place hold on <em>Computational methods for reliability and risk analysis.</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=788013</guid> </item> <item> <title> Defect prevention: use of simple statistical tools </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=68599</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Kane Victor E.<br /> New York Marcel Dekker 1989 .<br /> 688p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=68599">Place hold on <em>Defect prevention: use of simple statistical tools</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=68599</guid> </item> <item> <title> Design for reliability </title> <dc:identifier>ISBN:9780470486757 (hbk) | SL01559765</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=8331</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470486759.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Raheja Dev Ed.; Gullo Louis J Ed..<br /> Hoboken Wiley 2012 .<br /> xxiv,308p. , Include bibliographical references.; Index 285-308p. 9780470486757 (hbk) | SL01559765 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=8331">Place hold on <em>Design for reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=8331</guid> </item> <item> <title> Discrete Stochastic Models and Applications for Reliability Engineering and Statistical Quality Control </title> <dc:identifier>ISBN:9781003160632</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1741611</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1003160638.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Serkan Eryilmaz.<br /> Taylor and Francis 2022 9781003160632 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1741611">Place hold on <em>Discrete Stochastic Models and Applications for Reliability Engineering and Statistical Quality Control</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1741611</guid> </item> <item> <title> Distribution Reliability and Power Quality </title> <dc:identifier>ISBN:9781315220734</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1785426</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1315220733.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Lee Taylor; Thomas Allen Short.<br /> Taylor and Francis 2005 9781315220734 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1785426">Place hold on <em>Distribution Reliability and Power Quality</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1785426</guid> </item> <item> <title> Dynamic system reliability Modeling and analysis of dynamic and dependent behaviors </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=778195</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Xing Liudong.<br /> Hoboken Wiley 2019 .<br /> xvi,235p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=778195">Place hold on <em>Dynamic system reliability </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=778195</guid> </item> <item> <title> Elementary statistical quality control </title> <dc:identifier>ISBN:9780824790523 (hbk) | SL01562198</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=6777</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0824790529.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Burr John T.<br /> Boca Raton CRC Press 2005 .<br /> xviii, 449p. , Appendix 427-442p.; Index 447-449p. 9780824790523 (hbk) | SL01562198 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=6777">Place hold on <em>Elementary statistical quality control</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=6777</guid> </item> <item> <title> Encycopedia of statistics in quality and reliability </title> <dc:identifier>ISBN:9780470018613 (hbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1038478</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470018615.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ruggeri Fabrizio Ed..<br /> 2007 9780470018613 (hbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1038478">Place hold on <em>Encycopedia of statistics in quality and reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1038478</guid> </item> <item> <title> Encycopedia of statistics in quality and reliability </title> <dc:identifier>ISBN:9780470018613 (hbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1038477</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470018615.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ruggeri Fabrizio Ed..<br /> 2007 9780470018613 (hbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1038477">Place hold on <em>Encycopedia of statistics in quality and reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1038477</guid> </item> <item> <title> Encycopedia of statistics in quality and reliability </title> <dc:identifier>ISBN:9780470018613 (hbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1038476</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470018615.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ruggeri Fabrizio Ed..<br /> 2007 9780470018613 (hbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1038476">Place hold on <em>Encycopedia of statistics in quality and reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1038476</guid> </item> <item> <title> Encycopedia of statistics in quality and reliability </title> <dc:identifier>ISBN:9780470018613 (hbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1038475</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470018615.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ruggeri Fabrizio Ed..<br /> 2007 9780470018613 (hbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1038475">Place hold on <em>Encycopedia of statistics in quality and reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1038475</guid> </item> <item> <title> Engineering design for product and reliability </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=17776</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Priest John W.<br /> New York Marcel Dekker 1988 .<br /> 306p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=17776">Place hold on <em>Engineering design for product and reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=17776</guid> </item> <item> <title> Failure mode and effect analysis: FMEA from theory </title> <dc:identifier>ISBN:0873895983 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=39691</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0873895983.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Stamatis D H.<br /> Milwaukee ASQ Quality Press 2003 .<br /> xxxi,455p. , Includes bibliographical references.; Glossary cm. Includes CD-ROM.<br /> 0873895983 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=39691">Place hold on <em>Failure mode and effect analysis: FMEA from theory</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=39691</guid> </item> <item> <title> Failure mode and effect analysis: FMEA from theory to execution </title> <dc:identifier>ISBN:0873895983 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=39690</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0873895983.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Stamatis D H.<br /> Milwaukee ASQ Quality Press 2003 .<br /> xxxi,455p. , Includes bibliographical references.; Glossary 419-438p. cm. Includes with CD-ROM.<br /> 0873895983 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=39690">Place hold on <em>Failure mode and effect analysis: FMEA from theory to execution</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=39690</guid> </item> <item> <title> Fault Detectability in DWDM: Toward Higher Signal Quality and System Reliability </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1718471</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Kartalopoulos.<br /> IEEE 2001 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1718471">Place hold on <em>Fault Detectability in DWDM: Toward Higher Signal Quality and System Reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1718471</guid> </item> <item> <title> Harnessing green IT Principles and Practices </title> <dc:identifier>ISBN:9788126539680</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=617429</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/8126539682.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By MURUGESAN San.<br /> New Delhi Wiley-India 2012 .<br /> xxxiv, 395p , Bibliography: p 239-44 cm..<br /> 9788126539680 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=617429">Place hold on <em>Harnessing green IT</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=617429</guid> </item> <item> <title> Human resources management </title> <dc:identifier>ISBN:0824777166</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=623385</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0824777166.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Kern Jill P, and others Ed..<br /> New York Dekker 1987 .<br /> xiv,276p. , Bibliography chapterwise cm..<br /> 0824777166 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=623385">Place hold on <em>Human resources management</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=623385</guid> </item> <item> <title> Improving product reliability and software quality Strategies, tools, process and implementation </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=774710</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Levin Mark A..<br /> New Jersey Wiley 2019 .<br /> xlviii,408p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=774710">Place hold on <em>Improving product reliability and software quality</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=774710</guid> </item> <item> <title> Improving Product Reliability and Software Quality- Strategies, Tools, Process and Implementation 2e </title> <dc:identifier>ISBN:9781119179429</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1551757</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1119179424.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Mark A. Levin.<br /> Wiley 2019 9781119179429 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1551757">Place hold on <em>Improving Product Reliability and Software Quality- Strategies, Tools, Process and Implementation 2e</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1551757</guid> </item> <item> <title> Improving product reliability and software quality: Strategies, tools, process and implementation </title> <dc:identifier>ISBN:9781119179399 (hbk)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1734</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1119179394.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Levin Mark A..<br /> Hoboken Wiley 2019 .<br /> xiviii,408p. ill , Appendix 369-398p.index 399-408p. cm.<br /> 9781119179399 (hbk) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1734">Place hold on <em>Improving product reliability and software quality: Strategies, tools, process and implementation</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1734</guid> </item> <item> <title> Improving product reliability: Strategies and implementation </title> <dc:identifier>ISBN:0470854499 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=40090</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470854499.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Levin Mark A.<br /> Chichester John Wiley &amp; Sons Ltd. 2003 .<br /> xxvii, 313p. , Includes bibliographical references.; Appendix A-B, 283-306p. cm..<br /> 0470854499 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=40090">Place hold on <em>Improving product reliability: Strategies and implementation</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=40090</guid> </item> <item> <title> Improving product reliability: Strategies and implementation </title> <dc:identifier>ISBN:0470854499 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=40089</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0470854499.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Levin Mark A.<br /> Chichester John Wiley &amp; Sons Ltd. 2003 .<br /> xxvii, 313p. , Includes bibliographical references.; Appendix A-B, 283-306p. cm..<br /> 0470854499 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=40089">Place hold on <em>Improving product reliability: Strategies and implementation</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=40089</guid> </item> <item> <title> Improving reliability and quality for product success </title> <dc:identifier>ISBN:9781466503793 (hbk) | SL01561115</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=6462</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1466503793.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Ryu Dongsu.<br /> Boca Raton CRC 2012 .<br /> xiii,212p. , Appendix 189-205p.; Index 205-212p. 9781466503793 (hbk) | SL01561115 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=6462">Place hold on <em>Improving reliability and quality for product success</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=6462</guid> </item> <item> <title> Improving Reliability and Quality for Product Success </title> <dc:identifier>ISBN:9780429096365</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1762419</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0429096364.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Dongsu Ryu.<br /> Taylor and Francis 2012 9780429096365 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1762419">Place hold on <em>Improving Reliability and Quality for Product Success</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1762419</guid> </item> <item> <title> Integrated Circuit Quality and Reliability </title> <dc:identifier>ISBN:9781315274041</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=1815290</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1315274043.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Eugene R. Hnatek.<br /> Taylor and Francis 1995 9781315274041 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=1815290">Place hold on <em>Integrated Circuit Quality and Reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=1815290</guid> </item> <item> <title> Integrated circuits quality and reliability. </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=820785</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Hnatek Eugene R.<br /> 1987 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=820785">Place hold on <em>Integrated circuits quality and reliability.</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=820785</guid> </item> <item> <title> Introduction to quality and reliability engineering </title> <dc:identifier>ISBN:9787030442574</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=3736</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/7030442571.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Jiang Renyan.<br /> New York Springer 2015 .<br /> xxii,326p. ill. cm.<br /> 9787030442574 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=3736">Place hold on <em>Introduction to quality and reliability engineering</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=3736</guid> </item> <item> <title> Introduction to the basics of reliability and risk analysis </title> <dc:identifier>ISBN:9789812706393 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=22357</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812706399.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Zio Enrico.<br /> New Jersey World Scientific 2007 .<br /> xii, 222p. , Includes bibliographical references.; Appendix A-B, 217-222p. cm..<br /> 9789812706393 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=22357">Place hold on <em>Introduction to the basics of reliability and risk analysis</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=22357</guid> </item> <item> <title> Managing to achieve quality and reliability </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=574307</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Nixon Frank.<br /> London McGraw-Hill UK 1971 .<br /> xvi,290p Appendix p 256-75 cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=574307">Place hold on <em>Managing to achieve quality and reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=574307</guid> </item> <item> <title> Mathematical and statistical methods and methods in reliability: Application to medicine, finance, and quality control </title> <dc:identifier>ISBN:9780+817649708 (hbk) | SL01536229</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=13681</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/0817649700.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Rykov V V Ed.; Balakrishnan N Ed.; Nikulin M,S Ed..<br /> New York Birkhaus 2010 .<br /> xxvi;457p. , Include bibliographical references; Index 455-457p 9780+817649708 (hbk) | SL01536229 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=13681">Place hold on <em>Mathematical and statistical methods and methods in reliability: Application to medicine, finance, and quality control</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=13681</guid> </item> <item> <title> Mathematical and statistical methods in reliability </title> <dc:identifier>ISBN:9812383212 (hbd.)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=48680</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812383212.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Lindqvist Bo H Ed..<br /> New Jersey World Scientific Publishing Co. Pte. Ltd. 2003 .<br /> xix, 548p. , Includes bibliographical references cm..<br /> 9812383212 (hbd.) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=48680">Place hold on <em>Mathematical and statistical methods in reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=48680</guid> </item> <item> <title> Mathematical and statistical models and methods in reliability Applications to medicine,finance and quality control. </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=791848</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Rykov V V Ed..<br /> New York Birkhauser 2010 .<br /> xxvi,457p. cm..<br /> </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=791848">Place hold on <em>Mathematical and statistical models and methods in reliability </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=791848</guid> </item> <item> <title> Mathematical methods in survival analysis, reliability and quality of life </title> <dc:identifier>ISBN:9781848210103 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=18008</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1848210108.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Huber Catherine Ed..<br /> Great Britain Wiley 2008 .<br /> 369p. , Includes bibliographical references.; Appendices 353-366p.; Index 367-369p. cm..<br /> 9781848210103 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=18008">Place hold on <em>Mathematical methods in survival analysis, reliability and quality of life</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=18008</guid> </item> <item> <title> Mine safety:a modern approach </title> <dc:identifier>ISBN:9781849961141 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=26617</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/184996114X.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Dhillon B S.<br /> Berlin Springer-Verlag 2010 .<br /> xvi, 186p. , Includes bibliographical references.; Bibliography 159-184p.; Index 185-186p. cm..<br /> 9781849961141 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=26617">Place hold on <em>Mine safety:a modern approach</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=26617</guid> </item> <item> <title> Modelling quality assessment of software reliability and multi-upgradations </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=880811</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Jagvinder Singh.<br /> 2011 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=880811">Place hold on <em>Modelling quality assessment of software reliability and multi-upgradations</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=880811</guid> </item> <item> <title> Modelling quality assessment of software reliability and multi-upgradations </title> <dc:identifier>ISBN:</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=872596</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <p> By Jagvinder Singh.<br /> 2011 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=872596">Place hold on <em>Modelling quality assessment of software reliability and multi-upgradations</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=872596</guid> </item> <item> <title> Modern statistical and mathematical methods in reliability </title> <dc:identifier>ISBN:9812563563 (hbd)</dc:identifier> <!-- prettier-ignore-start --> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=44043</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/9812563563.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Wilson Alyson Ed..<br /> New Jersey World Scientific 2005 .<br /> xvii,409p , Includes bibliographical references 9812563563 (hbd) </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=44043">Place hold on <em>Modern statistical and mathematical methods in reliability</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=44043</guid> </item> </channel> </rss>
