Measurement techniques for radio frequency nanoelectronics

By: Contributor(s): Material type: TextLanguage: English Series: The Cambridge RF and microwave engineering seriesPublication details: Delhi Cambridge University Press India 2017Description: xiv,314p. cmSubject(s): DDC classification:
  • D65,44, Q7
Item type: Textual
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Cover image Item type Current library Home library Collection Shelving location Call number Materials specified Vol info URL Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Textual South Campus Library South Campus Library D65,44 Q7 (Browse shelf(Opens below)) Available SC1621930

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