Normal view MARC view ISBD view

Physical principles of electron microscopy:an introduction to TEM,SEM, and AEM

By:

Material type:

TextLanguage: English Publication details: New York Springer 2007Description: ix, 202p. cmISBN:

Subject(s):

DDC classification:

Item type:

Textbook

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Textbook	Department of Physics and Astrophysics Library	Department of Physics and Astrophysics Library			G:19 P7 Carpa (Browse shelf(Opens below))					Available			PA0006304

Appendix 191-194p.; References 195-196p.; Index 197-202p.

There are no comments on this title.

to post a comment.