Your search returned 83 results.

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Advanced Mathematical and Computational Tools in Metrology and Testing Ix by

Pavese Franco Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2012

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Advanced Mathematical and Computational Tools in Metrology and Testing Viii by

Pavese Franco Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2009

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Advanced Mathematical and Computational Tools in Metrology and Testing X by

Pavese Franco Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2015

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Advanced Mathematical and Computational Tools in Metrology and Testing Xi by

Forbes Alistair Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2018

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Advanced Mathematical and Computational Tools in Metrology and Testing Xii by

Pavese Franco Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2022

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Advanced Mathematical and Computational Tools in Metrology Iv by

Ciarlini P Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2000

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Advanced Mathematical and Computational Tools in Metrology V by

Ciarlini P Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2001

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Advanced Mathematical and Computational Tools in Metrology Vi by

Ciarlini Patrizia Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2004

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Advanced Mathematical and Computational Tools in Metrology Vii by

Ciarlini Patrizia Et Al

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2006

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10.

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Advanced Mathematical Tools in Metrology - Proceedings of the International Workshop by

Pavese F Et Al

Material type:

Text

Language: English

Publication details: World Scientific ; WSPC ; 1994

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11.

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Advanced Mathematical Tools in Metrology Iii by

Cnr, Istituto Di Metrologia Torino, Italy

Material type:

Text

Language: English

Publication details: World Scientific ; WSPC ; 1997

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12.

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Advanced Metrology by

Jiang, X

Material type:

Text; Format: print

Language: English

Publication details: Academic Press Elsevier 2020

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13.

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties by

Dahoo

Material type:

Text; Format: print

Language: English

Publication details: IEEE

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14.

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Applications and Metrology at Nanometer-Scale 1 - Smart Materials, Electromagnetic Waves and Uncertainties by

Pierre-Richard Dahoo

Material type:

Text; Format: print

Language: English

Publication details: Wiley ; 2021

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15.

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Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method by

Pierre-Richard Dahoo

Material type:

Text; Format: print

Language: English

Publication details: Wiley ; 2021

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16.

Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method by

Dahoo

Material type:

Text; Format: print

Language: English

Publication details: IEEE

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17.

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Basic Metrology for ISO 9000 Certification by

G. M. S. de Silva

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2002

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18.

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Characterization, Testing, Measurement, and Metrology by

Chander Prakash; Sunpreet Singh; J. Paulo Davim

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2020

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19.

Coinage and metrology of the sultan of Delhi incorporating a catologue of the coins in the author's cabinet now in the Delhi Museum by

Wright H Nelson

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: NA NA 1936

Availability: Items available for loan: Arts Library (1)Collection, call number: V2:73:J5 G6-;1.

20.

Coinage and metrology of the sultan of Delhi incorporating a catologue of the coins in the author's cabinet now in the Delhi Museum by

Wright H Nelson

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: NA NA 1936

Availability: Items available for loan: Arts Library (1)Collection, call number: V2:73:J5 G6-;1.

21.

Coinage and metrology of the sultans of Dehli by

Wright H Nelson

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: New Delhi Oriental Books 1974

Availability: Items available for loan: South Campus Library (1)Collection, call number: V2:73aI L4.

22.

Course in workshop technology by

Series: Manufacturing processes

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: Delhi Dhanpat rai 2003

Availability: No items available.

23.

Course in workshop technology by

Edition: 9

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: Delhi Dhanpat rai

Availability: No items available.

24.

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Dimensional Metrology by

Han Haitjema; Richard Leach

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2025

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25.

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Encyclopaedia of Historical Metrology, Weights, and Measures by

Jan Gyllenbok

Material type:

Text; Format: print

Language: English

Publication details: Springer ; Springer ; 2018

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26.

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Encyclopaedia of Historical Metrology, Weights, and Measures by

Jan Gyllenbok

Material type:

Text; Format: print

Language: English

Publication details: Springer ; Springer ; 2018

Online resources:

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27.

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Encyclopaedia of Historical Metrology, Weights, and Measures by

Jan Gyllenbok

Material type:

Text; Format: print

Language: English

Publication details: Springer ; Springer ; 2018

Online resources:

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28.

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Engineering metrology by

Jain R K

Edition: 19

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: Delhi Khanna Publishers 2005

Availability: No items available.

29.

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Engineering metrology by

Jain R K

Edition: 19

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: Delhi Khanna Publishers 2005

Availability: Items available for loan: Central Science Library (1)Collection, call number: D:b6 P5.

30.

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Engineering Metrology for Pedestrian Falls Prevention and Protection by

In-Ju Kim

Material type:

Text; Format: print

Language: English

Publication details: Springer ; Springer ; 2022

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31.

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Forensic Metrology by

Alessandro Ferrero, Veronica Scotti

Material type:

Text; Format: print

Language: English

Publication details: Springer ; Springer ; 2022

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32.

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Frequency Standards and Metrology - Proceedings of the 7Th Symposium by

Maleki Lute

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2009

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33.

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Frequency Standards and Metrology - Proceedings of the Fifth Symposium by

Bergquist James C

Material type:

Text

Language: English

Publication details: World Scientific ; WSPC ; 1996

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34.

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Frequency Standards and Metrology, Procs of the 6Th Symposium by

Gill P

Material type:

Text; Format: print

Language: English

Publication details: World Scientific ; WSPC ; 2002

Online resources:

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35.

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications by

Servin

Material type:

Text; Format: print

Language: English

Publication details: IEEE

Online resources:

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36.

Graphene nanoelectronics Metrology,synthesis,properties and applications. by

Raza Hassan Ed

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: Berlin Springer 2012

Availability: Items available for loan: South Campus Library (1)Collection, call number: D65152 Q2.

37.

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Graphene nanoelectronics : Metrology, syenthesis, properties and applications by

Raza Hassan Ed

Series: Nanoscience and technology

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: Berlin Springer 2012

Availability: Items available for loan: Department of Physics and Astrophysics Library (1)Collection, call number: C21:(D) Q2 Carpa.

38.

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Handbook of 3D Machine Vision Optical Metrology and Imaging by

Song Zhang

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2013

Online resources:

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39.

Handbook of industrial metrology by

A.S.T.M.E

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: 1967

Availability: Items available for loan: Central Library (1).

40.

Handbook of industrial metrology by

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: 1967

Availability: Items available for loan: Central Science Library (1)Collection, call number: D::78e0X9 K7;1.

41.

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Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication (Volume Four) by

Chunlei Guo; Chandra Subhash Singh

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2021

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42.

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Handbook of Optical Dimensional Metrology by

Kevin Harding

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2013

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43.

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Handbook of Optical Metrology Principles and Applications, Second Edition by

Toru Yoshizawa

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2015

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44.

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Handbook of optical metrology:principles and applications by

Yoshizawa Toru Ed

Material type:

Text; Format: print regular print ; Literary form: Not fiction

Language: English

Publication details: Boca Raton CRC Press 2009

Availability: Items available for loan: Department of Physics and Astrophysics Library (1)Collection, call number: C5:fg P9 Carpa.

45.

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Handbook of Optical Sensors by

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: Boca: Raton CRC, 2015

Availability: Items available for loan: Central Science Library (1)Collection, call number: C5g Q5.

46.

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Handbook of Silicon Semiconductor Metrology by

Alain C. Diebold

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2001

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47.

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Handbook of Surface Metrology by

David J. Whitehouse

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 1994

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48.

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High Definition Metrology Based Surface Quality Control and Applications by

Shichang Du, Lifeng Xi

Material type:

Text; Format: print

Language: English

Publication details: Springer ; Springer ; 2019

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49.

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High-Productivity Drilling Tools Materials, Metrology, and Failure Analysis by

Viktor P. Astakhov

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2024

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50.

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Introduction to Optical Metrology by

Rajpal S. Sirohi

Material type:

Text; Format: print

Language: English

Publication details: Taylor and Francis ; 2016

Online resources:

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Your search returned 83 results.