000 01007nam a2200325Ia 4500
003 OSt
005 20221007123132.0
006 a|||||r|||| 00| 0
007 ta
008 221006b |||||||| |||| 00| 0 eng d
020 _a9781119356103 (hbk)
024 _a199647
037 _b356, 14/03/2019, Sai Global Indian Books
_cTextual
040 _aPAPL
_cPAPL
_beng
041 _2eng
_aeng
082 _aC53:55, Q8 Carpa
100 _aHe Bob B
_9716601
245 0 _aTwo-dimensional x-ray diffraction
250 _a2
260 _aHoboken
_bJohn Wiley
_c2018
300 _axv, 472p. ill.
_ccm.
500 _aAppendix A-B 453-464p.; Index 465-472p.
650 _a Combinatorial screening
_9716602
650 _a Stress measurment
_9716603
650 _a Texture analysis
_9716604
650 _a X-ray detectors
_9716605
650 _aPhysics
942 _hC53:55, Q8 Carpa
_cTEXL
_2CC
999 _c1211421
_d1211421