000 00571nam a2200193Ia 4500
005 20250508153204.0
008 008 250505s9999 xx 000 0 eng d
037 _aTextual
040 _aFEDL
_beng
_cFEDL
041 _aeng
_2eng
084 _a001.422, RAD
_qFEDL
100 _aRao C Radhakrishna
245 0 _aAdvanced statistical methods in biometric research
260 _aNew York, USA
_bJohn Wiley and Sons
_c1952
300 _axvii,389p.
650 _aStatistics Methods
_9756281
942 _cTEXL
_h001.422, RAD
999 _c1341132
_d1341132