000 00577nam a2200169Ia 4500
005 20250508154944.0
008 008 250505s9999 xx 000 0 eng d
037 _aBooks to be hide in OPAC
040 _aFEDL
_beng
_cFEDL
041 _aeng
_2eng
084 _a001.422, UNI/O
_qFEDL
245 0 _aSequential analysis in inspection and experimentation
260 _aNew York, USA
_b Columbia University Press
_c1945
546 _aSection 1 of sequential analysis of statistical data: Applications
942 _cHB
_h001.422, UNI/O
999 _c1353108
_d1353108