| 000 | 01107nam a2200373Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912144639.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9783319001210 (hbk) | ||
| 020 | _aSL01562768 | ||
| 024 | _a192638 | ||
| 037 | _b2780, 06/02/2015, Ashutosh Technical Books | ||
| 037 | _cTextbook | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aB2T0bD:4, Q0;Q3 TC | ||
| 100 | _aMcpherson J W | ||
| 245 | 0 | _aReliability physics and engineering | |
| 250 | _a2 | ||
| 260 |
_aNew York _bSpringer _c2013 |
||
| 300 | _axvi, 399p. ill. | ||
| 500 | _aBibliography 376-376p.; Appendices 377-390p.; Index 391-399p. | ||
| 650 | _a Accelerated degradation | ||
| 650 | _a Screening | ||
| 650 | _aGaussian statistics | ||
| 700 | _a Kadereit Joachim W | ||
| 700 | _a Neuhaus Gunther | ||
| 700 | _a Sonnewald Uwe | ||
| 700 | _aMcpherson J W | ||
| 942 |
_hB2T0bD:4, Q0;Q3 TC _cTB _2CC |
||
| 999 |
_c14642 _d14642 |
||