| 000 | 00997nam a2200325Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912144032.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9781461443360 (hbk) | ||
| 024 | _a197571 | ||
| 037 | _b50, 07/03/2017, Aviva Books Company | ||
| 037 | _cTextual | ||
| 040 | _beng | ||
| 041 | _aeng | ||
| 082 | _aC6:212g, Q3 | ||
| 100 | _aUeda Osamu Ed. | ||
| 245 | 0 | _aMaterials and reliability handbook for semiconductor optical and electron devices | |
| 260 |
_aDordrecht _bSpringer _c2013 |
||
| 300 |
_axv,616p. col.ill. _ccm |
||
| 500 | _aIndex 611-616p. | ||
| 650 | _a InGaN laser diode degradation | ||
| 650 | _a Reliability simulation | ||
| 650 | _a Reliability testing | ||
| 650 | _aPhysics | ||
| 700 | _a Pearton Stephen J. Ed. | ||
| 942 |
_hC6:212g, Q3 _cTEXL _2CC |
||
| 999 |
_c1493 _d1493 |
||