| 000 | 00678nam a2200253Ia 4500 | ||
|---|---|---|---|
| 005 | 20260121114118.0 | ||
| 008 | 008 260114s9999 xx 000 0 eng d | ||
| 020 | _a9781119808244 | ||
| 037 | _aEBOOK | ||
| 040 | _aCRL | ||
| 040 | _beng | ||
| 040 | _cCRL | ||
| 041 | _2eng | ||
| 041 | _aeng | ||
| 084 | _qCRL | ||
| 100 |
_aPierre-Richard Dahoo _9971011 |
||
| 245 | 0 | _aApplications and Metrology at Nanometer-Scale 1 - Smart Materials, Electromagnetic Waves and Uncertainties | |
| 260 | _bWiley | ||
| 260 | _c2021 | ||
| 856 | _uhttps://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244 | ||
| 942 | _cEBOOK | ||
| 999 |
_c1550266 _d1550266 |
||