| 000 | 00751nam a2200265Ia 4500 | ||
|---|---|---|---|
| 005 | 20260121170227.0 | ||
| 008 | 008 260114s9999 xx 000 0 eng d | ||
| 020 | _a9781493966769 | ||
| 037 | _aEBOOK | ||
| 040 | _aCRL | ||
| 040 | _beng | ||
| 040 | _cCRL | ||
| 041 | _2eng | ||
| 041 | _aeng | ||
| 084 | _qCRL | ||
| 100 |
_aJoseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy _91061337 |
||
| 245 | 0 | _aScanning Electron Microscopy and X-Ray Microanalysis | |
| 260 | _bSpringer | ||
| 260 | _bSpringer | ||
| 260 | _c2018 | ||
| 856 | _uhttps://link.springer.com/openurl?genre=book&isbn=978-1-4939-6676-9 | ||
| 942 | _cEBOOK | ||
| 999 |
_c1627066 _d1627066 |
||