000 00715nam a2200265Ia 4500
005 20260121171400.0
008 008 260114s9999 xx 000 0 eng d
020 _a9783030261726
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aSheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr
_91075541
245 0 _aLong-Term Reliability of Nanometer VLSI Systems
260 _bSpringer
260 _bSpringer
260 _c2019
856 _uhttps://link.springer.com/openurl?genre=book&isbn=978-3-030-26172-6
942 _cEBOOK
999 _c1641271
_d1641271