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| 005 | 20260320200835.0 | ||
| 008 | 008 262003s9999 xx 000 0 eng d | ||
| 020 | _a9781580537100 | ||
| 037 | _aEBOOK | ||
| 040 | _aCRL | ||
| 040 | _beng | ||
| 040 | _cCRL | ||
| 041 | _2eng | ||
| 041 | _aeng | ||
| 084 | _qCRL | ||
| 100 | _aKelly | ||
| 245 | 0 | _aAdvanced Production Testing of RF, SoC, and SiP Devices | |
| 260 | _bIEEE | ||
| 260 | _c2006 | ||
| 856 | _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=9101170 | ||
| 942 | _cEBOOK | ||
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