000 00576nam a2200241Ia 4500
005 20260320200926.0
008 008 262003s9999 xx 000 0 eng d
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aLourandakis
_91133804
245 0 _aOn-Wafer Microwave Measurements and De-embedding
260 _bIEEE
260 _c2016
856 _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=9100998
942 _cEBOOK
999 _c1717720
_d1717720