000 00714nam a2200277Ia 4500
005 20260324112425.0
008 008 260324s9999 xx 000 0 eng d
020 _a9780429263491
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aDuanli Yan; David J. Weiss; Alina A. von Davier
_91142638
245 0 _aResearch for Practical Issues and Solutions in Computerized Multistage Testing
260 _bTaylor and Francis
260 _c2024
365 _a
365 _b220
856 _uhttp://www.taylorfrancis.com/books/9780429263491
942 _cEBOOK
999 _c1731837
_d1731837