000 00740nam a2200289Ia 4500
005 20260324114810.0
008 008 260324s9999 xx 000 0 eng d
020 _a9781003147633
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aKrzysztof Iniewski; Jan S. Iwanczyk
_91152209
245 0 _aRadiation Detection Systems
245 0 _bSensor Materials, Systems, Technology, and Characterization Measurements
260 _bTaylor and Francis
260 _c2021
365 _a
365 _b275
856 _uhttp://www.taylorfrancis.com/books/9781003147633
942 _cEBOOK
999 _c1742592
_d1742592