000 00637nam a2200277Ia 4500
005 20260324121201.0
008 008 260324s9999 xx 000 0 eng d
020 _a9780203115190
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aJ. Patrick Meyer
_91161520
245 0 _aApplied Measurement with jMetrik
260 _bTaylor and Francis
260 _c2014
365 _a
365 _b265
856 _uhttp://www.taylorfrancis.com/books/9780203115190
942 _cEBOOK
999 _c1753457
_d1753457