000 00684nam a2200277Ia 4500
005 20260324122948.0
008 008 260324s9999 xx 000 0 eng d
020 _a9781315218021
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aJustyna Zander; Ina Schieferdecker; Pieter J. Mosterman
_91168501
245 0 _aModel-Based Testing for Embedded Systems
260 _bTaylor and Francis
260 _c2012
365 _a
365 _b435
856 _uhttp://www.taylorfrancis.com/books/9781315218021
942 _cEBOOK
999 _c1761604
_d1761604