| 000 | 01232nam a2200277Ia 4500 | ||
|---|---|---|---|
| 005 | 20260324130655.0 | ||
| 008 | 008 260324s9999 xx 000 0 eng d | ||
| 020 | _a9781315221878 | ||
| 037 | _aEBOOK | ||
| 040 | _aCRL | ||
| 040 | _beng | ||
| 040 | _cCRL | ||
| 041 | _2eng | ||
| 041 | _aeng | ||
| 084 | _qCRL | ||
| 100 |
_aRon Kielmeyer; Patrick Fay; Anthony Parker; Christopher Jones; John C. Cowles; J-P Lanteri; James Grantley Rathmell; Paul D. Hale; Kate A. Remley; Aaron Radomski; Todd Heckleman; Douglas A. Teeter; Edward T. Spears; Joseph M. Gering; Troels Nielsen; John Wendler, P; H. Mike Harris; Jakub Kucera; Peter Blakey; Urs Lott; John F. Sevic; Daniel G. Swanson; Mike Golio; Janet Golio; Robert Trew; Michael Steer; Lawrence P. Dunleavy; Charles Nelson; Robert Newgard; Jonathan B. Scott; John R. Mahon; M. Tentzeris; Brent Irvine; Ronald E. Ham; Walter R. Curtice; J. Stevenson Kenney; Alfy Riddle _91182665 |
||
| 245 | 0 | _aRF and Microwave Circuits, Measurements, and Modeling | |
| 260 | _bTaylor and Francis | ||
| 260 | _c2007 | ||
| 365 | _a | ||
| 365 | _b465 | ||
| 856 | _uhttp://www.taylorfrancis.com/books/9781315221878 | ||
| 942 | _cEBOOK | ||
| 999 |
_c1779042 _d1779042 |
||