| 000 | 01367nam a2200277Ia 4500 | ||
|---|---|---|---|
| 005 | 20260324131353.0 | ||
| 008 | 008 260324s9999 xx 000 0 eng d | ||
| 020 | _a9781315221700 | ||
| 037 | _aEBOOK | ||
| 040 | _aCRL | ||
| 040 | _beng | ||
| 040 | _cCRL | ||
| 041 | _2eng | ||
| 041 | _aeng | ||
| 084 | _qCRL | ||
| 100 |
_aPrabhat Mishra; Enrico Macii; Kenneth L. McMillan; Alain Clouard; John Sanguinetti; Franz E. Marschner; Marco Di Natale; Ralph H. Otten; Grant Martin; Ahmed Jerraya; Robert F. Damiano; Stephen A. Edwards; Kwang-Ting(Tim) Cheng; Marcello Coppola; Limor Fix; Steven Howard Leibson; Bozena Kaminska; Bernd Koenemann; Gaurav Singh; John Wilson; Miltos D. Grammatikakis; Wayne Wolf; Sumit Gupta; Sandeep Shukla; Vivek Tiwari; Renu Mehra; Massimo Poncino; Shuvra S. Bhattacharyya; Mike Bershteyn; Raul Camposano; Iuliana Bacivarov; Nikil Dutt; Li-Chung Wang; Harry D. Foster; Jean-Philippe Strassen; Frank Ghenassia; Laurent Maillet-Contoz; Joseph Tobin Buck; Naehyuck Chang; Louis Scheffer; Luciano Lavagno; Ray Turner; Rajesh Gupta _91185262 |
||
| 245 | 0 | _aEDA for IC System Design, Verification, and Testing | |
| 260 | _bTaylor and Francis | ||
| 260 | _c2006 | ||
| 365 | _a | ||
| 365 | _b340 | ||
| 856 | _uhttp://www.taylorfrancis.com/books/9781315221700 | ||
| 942 | _cEBOOK | ||
| 999 |
_c1782336 _d1782336 |
||