000 01363nam a2200277Ia 4500
005 20260324132039.0
008 008 260324s9999 xx 000 0 eng d
020 _a9781315220833
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aDavid R. Medeiros; Michael T. Postek; Hal Kusunose; Takayoshi Matsuyama; A. Meyyappan; Min Bai; Sergey Babin; Andreas Erdmann; Ray J. Hoobler; Christian Kalus; Kurt R. Kimmel; Randall Lee; Vladimir Liberman; Wilhelm Maurer; S. Muckenhirn; James Potzick; Masatoshi Oda; C. Grant Willson; P.J.M. van Adrichem; Joerg Butschke; Shirley Hemar; Frank-Michael Kamm; Florian Letzkus; Hans Loeschner; Franklin Schellenberg; Yoshio Nishi; Michael T. Takac; Shane R. Palmer; Syed Rizvi; Hisatake Sano; R. Lal Tummala; Christer Rydberg; Anja Rosenbusch; Norio Saitou; Pei-yang Yan; Yung-Tsai Yen; Andrew G. Zanzal; Axel Zibold; Nobuyuki Yoshioka; Ebru Apak; Makato Yonezawa; Michael Lercel; R. Fabian Pease; Dachen Chu; Benjamen M. Rathsack
_91187832
245 0 _aHandbook of Photomask Manufacturing Technology
260 _bTaylor and Francis
260 _c2005
365 _a
365 _b560
856 _uhttp://www.taylorfrancis.com/books/9781315220833
942 _cEBOOK
999 _c1785528
_d1785528