000 00715nam a2200277Ia 4500
005 20260324132721.0
008 008 260324s9999 xx 000 0 eng d
020 _a9780429208836
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aMichael J. LuValle; Bruce G. LeFevre; SirRaman Kannan
_91190355
245 0 _aDesign and Analysis of Accelerated Tests for Mission Critical Reliability
260 _bTaylor and Francis
260 _c2004
365 _a
365 _b120
856 _uhttp://www.taylorfrancis.com/books/9780429208836
942 _cEBOOK
999 _c1788694
_d1788694