000 01001nam a2200277Ia 4500
005 20260324134805.0
008 008 260324s9999 xx 000 0 eng d
020 _a9781315220239
037 _aEBOOK
040 _aCRL
040 _beng
040 _cCRL
041 _2eng
041 _aeng
084 _qCRL
100 _aChadi El Chemali; Arnon M. Hurwitz; Argon Chen; Ruey-Shan Guo; William Moyne; Nital Patel; Taber H. Smith; Duane Boning; Jin-Jung Chen; Robert A. Soper; Jinn-Yi Yeh; Jonathan Chapple-Sokol; Naumann Chaudhry; John Colt; Rock Nadeau; Tarun Parikh; Elke Rundensteiner; Paul H. Smith; Joe White; Victor Solakhian; James Moyne; Enrique del Castillo; B. Karumullah Khan
_91198168
245 0 _aRun-to-Run Control in Semiconductor Manufacturing
260 _bTaylor and Francis
260 _c2001
365 _a
365 _b370
856 _uhttp://www.taylorfrancis.com/books/9781315220239
942 _cEBOOK
999 _c1798597
_d1798597