| 000 | 00676nam a2200265Ia 4500 | ||
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| 005 | 20260324152847.0 | ||
| 008 | 008 260324s9999 xx 000 0 eng d | ||
| 020 | _a9780323241434 | ||
| 037 | _aEBOOK | ||
| 040 | _aCRL | ||
| 040 | _beng | ||
| 040 | _cCRL | ||
| 041 | _2eng | ||
| 041 | _aeng | ||
| 084 | _qCRL | ||
| 100 |
_aZalevsky, Zeev _91229947 |
||
| 245 | 0 | _aNew Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices | |
| 260 | _bElsevier | ||
| 260 | _c2013 | ||
| 650 | _aEngineering | ||
| 856 | _uhttps://www.sciencedirect.com/science/book/9780323241434 | ||
| 942 | _cEBOOK | ||
| 999 |
_c1840899 _d1840899 |
||