| 000 | 00723nam a2200253Ia 4500 | ||
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| 003 | OSt | ||
| 005 | 20220912145136.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 024 | _a71272 | ||
| 037 | _cTextual | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aG:1996, L5 | ||
| 100 | _aSiegel Benjamin M Ed. | ||
| 245 | 0 | _aPhysical aspects of electron microscopy and micro beam analysis | |
| 260 |
_aNew York _bJohn wiley _c1975 |
||
| 300 |
_axiii,474p. _ccm. |
||
| 650 | _aElectron microscopy | ||
| 700 | _a Beaman Donald R Ed. | ||
| 942 |
_hG:1996, L5 _cTEXL _2CC |
||
| 999 |
_c24265 _d24265 |
||