| 000 | 01000nam a2200325Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912144109.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9789814436922 (HBK) | ||
| 024 | _a200649 | ||
| 037 | _b5329, 07/02/2019, Ashutosh Technical Books | ||
| 037 | _cTextual | ||
| 040 | _beng | ||
| 041 | _aeng | ||
| 082 | _aC53:58, Q5 | ||
| 100 | _aFewster Paul F | ||
| 245 | 0 | _aX-Ray scattering form semiconductors and other materials | |
| 250 | _a3 | ||
| 260 |
_aNew Jersey _bWorld Scientific _c2015 |
||
| 300 |
_axvi,493p. ill. _ccm |
||
| 500 | _aAppendix 479-487p.; Index 489-493p. | ||
| 650 | _a Estimation of strutural parameters and interpretation | ||
| 650 | _a Measuring scattering patterns | ||
| 650 | _a Theory of X-ray scattering | ||
| 650 | _aPhysics | ||
| 942 |
_hC53:58, Q5 _cTEXL _2CC |
||
| 999 |
_c3166 _d3166 |
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