000 00985nam a2200313Ia 4500
003 OSt
005 20220912150121.0
006 a|||||r|||| 00| 0
007 ta
008 220909b |||||||| |||| 00| 0 eng d
020 _a0471184500 (NewYork:hbd)
024 _a6783
037 _bAshutosh,
037 _cTextual
040 _aCSL
_beng
_cCSL
041 _aeng
082 _aB2T0bD:4, P0
100 _aBlischke Wallace R
245 0 _aReliability: modeling, prediction, and optimization
260 _aNew York John wiley Sons, Inc
_c2000
300 _axxvii,812p
490 _aWiley series in probability and statistics. Applied probability and statistics section
500 _aBibliographical references 771-795p; Index 797-812p
650 _a Reliability
650 _aOperations research
700 _a Murthy D N Prabhakar
942 _hB2T0bD:4, P0
_cTEXL
_2CC
999 _c39950
_d39950