000 01038nam a2200313Ia 4500
003 OSt
005 20220912150508.0
006 a|||||r|||| 00| 0
007 ta
008 220909b |||||||| |||| 00| 0 eng d
020 _a0306472929 (hbd)
024 _a2191
037 _cTextbook
040 _aCSL
_beng
_cCSL
041 _aeng
082 _aG:1996, P3 TH
100 _aGoldstein Joseph I.
245 0 _aScanning electron microscopy and X-ray microanalysis
250 _a3
260 _aNew York
_b Kluwer Academic/Plenum Publishers
_c2003
300 _axix, 689p.
_ccm. Includes with CD-ROM
500 _aIncludes bibliographical references; Index 675-689p
700 _a Echlin Patrick
700 _a Joy David C.
700 _a Lyman Charles E.
700 _a Newbury Dale E.
942 _hG:1996, P3 TH
_cTB
_2CC
999 _c48582
_d48582