| 000 | 00872nam a2200301Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912150543.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 020 | _a0306464152 (hbd) | ||
| 024 | _a8228 | ||
| 037 | _bOverseas, | ||
| 037 | _cTextual | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aC9B2:(G:19), P0 | ||
| 100 | _aMiller M K | ||
| 245 | 0 | _aAtom probe tomography: analysis at the atomic level | |
| 260 |
_aNew York _b Kluwer Academic/Plenum Publisher _c2000 |
||
| 300 | _axiv,239p | ||
| 500 | _aBibliography 197-216p; Appendix A-G, 217-235p; Index 237-239p | ||
| 650 | _a Atom-probe field ion microscopy | ||
| 650 | _a Tomography | ||
| 650 | _aPhysics | ||
| 942 |
_hC9B2:(G:19), P0 _cTEXL _2CC |
||
| 999 |
_c49768 _d49768 |
||