| 000 | 01063nam a2200325Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912150549.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 020 | _a0471697362 (pbk) | ||
| 024 | _a13336 | ||
| 037 | _b277, 14/01/2005, Ashutosh Technical Books | ||
| 037 | _cTextbook | ||
| 040 |
_aCSL _beng _cCSL |
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| 041 | _aeng | ||
| 082 | _aB2T0bD:4, P4 TB | ||
| 100 | _aNelson Wayne B | ||
| 245 | 0 | _aAccelerated testing statistical models, test plans and data analysis | |
| 260 |
_aHoboken John Wiley & Sons, Inc. _c2004 |
||
| 300 |
_axiv, 601p. _ccm. |
||
| 490 | _aWiley series in probability and statistics | ||
| 500 |
_aAppendix A, 549-560p. _ccm.; Bibliographical references 561-577p. _ccm.; Index 579-601p. _ccm. |
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| 650 | _a Data analysis | ||
| 650 | _a Design | ||
| 650 | _a Operational research | ||
| 650 | _aMathematics | ||
| 942 |
_hB2T0bD:4, P4 TB _cTB _2CC |
||
| 999 |
_c50109 _d50109 |
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