000 00624nam a2200229Ia 4500
003 OSt
005 20220912150729.0
006 a|||||r|||| 00| 0
007 ta
008 220909b |||||||| |||| 00| 0 eng d
024 _a25827
037 _cTextual
040 _aCSL
_beng
_cCSL
041 _aeng
082 _aB281, L8
100 _aBain Lee J
245 0 _aStatistical analysis of reliability and life-testing models : Theory and methods
260 _aNew York
_b Marcel Dekker
_c1978
300 _axii,450p.
_ccm.
942 _hB281, L8
_cTEXL
_2CC
999 _c53467
_d53467