| 000 | 00760nam a2200277Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912150801.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 024 | _a48877 | ||
| 037 | _cTextual | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aC6:212, M1 | ||
| 100 | _aHowes M J Ed. | ||
| 245 | 0 | _aReliability and degradation | |
| 260 |
_aChichester _bJohn Wiley _c1981 |
||
| 300 |
_axii, 444p. _ccm. |
||
| 490 | _aWiley series in solid state devices and circuits | ||
| 500 | _aIncludes bibliography | ||
| 650 | _aSemiconductors | ||
| 700 | _a Morgan D V Ed. | ||
| 942 |
_hC6:212, M1 _cTEXL _2CC |
||
| 999 |
_c54874 _d54874 |
||