| 000 | 00715nam a2200277Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912151519.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 024 | _a33175 | ||
| 037 | _cTextual | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aD65,2, M7 | ||
| 100 | _aMiller D M Ed. | ||
| 245 | 0 | _aDevelopments in integrated circuit testing | |
| 260 |
_aLondon _bAcademic Press _c1987 |
||
| 300 |
_a440p. _ccm. |
||
| 490 | _aPerspective in computing; 18 | ||
| 650 | _a Circuits | ||
| 650 | _a Electronics | ||
| 650 | _aEngineering | ||
| 942 |
_hD65,2, M7 _cTEXL _2CC |
||
| 999 |
_c70380 _d70380 |
||