000			01621nam a2200289Ia 4500
003			OSt
005			20250717103829.0
008			220909b |||||||| |||| 00| 0 eng d
020			_a0471607118
037			_cTextbook
040			_aCSL _beng _cCSL
041			_aeng
084			_aC216-53:8 K81;M9 TE _qCSL
100			_aStout, George H _eauthor _9719956
245		0	_aX-ray structure determination : a practical guide
250			_a2nd ed.
260			_aCanada : _bWiley, _c1989.
300			_axv, 453p. _b: ill.
500			_aAppendixes 421-440p.; Index 441-453p.
520			_aClosely follows an actual structural determination. After some introductory material on the nature of x-rays, the diffraction process, and the internal geometry of crystals, the selection and preparation of a crystal are considered. Techniques of measuring raw x-ray data are covered, plus their reduction into a useable form. The second part discusses both traditional and novel methods of solving the ``phase'' problem, the principal difficulty in x-ray structure determination. The third part considers how to extract the most information from the data and how to evaluate its reliability. Finally, there is a discussion of sources of error in practice and interpretation.
650			_a Crystals _9815836
650			_a Patterson methods _9815837
650			_aDerived results _9815838
700			_aJensen, Lyleh H _eco-author _9815839
942			_hC216-53:8 K81;M9 TE _cTB _2CC _n0
999			_c7673 _d7673