| 000 | 00542nam a2200217Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220928140148.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220927b |||||||| |||| 00| 0 eng d | ||
| 024 | _a7039 | ||
| 037 | _cTextual | ||
| 040 |
_aSDCL _cSDCL _beng |
||
| 041 |
_2eng _aeng |
||
| 082 | _aD:81, N6 | ||
| 100 |
_aUeda Osamu _9494274 |
||
| 245 | 0 | _aRelibility and degradation of III-V potical devices | |
| 260 | _c1996 | ||
| 942 |
_hD:81, N6 _cTEXL _2CC |
||
| 999 |
_c810167 _d810167 |
||