| 000 | 00957nam a2200325Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220912144431.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220909b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9789814630351 (pbk) | ||
| 020 | _aSL01599900 | ||
| 024 | _a194976 | ||
| 037 | _b3414, 04/12/2015, Ashutosh Technical Books | ||
| 037 | _cTextual | ||
| 040 |
_aCSL _beng _cCSL |
||
| 041 | _aeng | ||
| 082 | _aC9B3, Q6 TC | ||
| 100 | _aReifenberger Ronald | ||
| 245 | 0 | _aFundamentals of atomic force microscopy | |
| 260 |
_aHackensack _bWorld Scientific _c2016 |
||
| 300 | _axv, 324p. ill. | ||
| 500 | _aIndex 319-324p. | ||
| 650 | _a AFM system components | ||
| 650 | _a Experimental calibrations | ||
| 650 | _aContact mode AFM | ||
| 700 | _aReifenberger Ronald | ||
| 942 |
_hC9B3, Q6 TC _cTEXL _2CC |
||
| 999 |
_c8192 _d8192 |
||