| 000 | 00806nam a2200241Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20220930070747.0 | ||
| 006 | a|||||r|||| 00| 0 | ||
| 007 | ta | ||
| 008 | 220926b |||||||| |||| 00| 0 eng d | ||
| 024 | _a7467 | ||
| 037 | _cTheses | ||
| 040 |
_aCRL _cCRL _beng |
||
| 041 |
_2eng _aeng |
||
| 100 |
_aRay U. C. _9527544 |
||
| 110 | _aUniversity of Delhi. Faculty of Technology. Department of Electrical Engineering | ||
| 245 | 0 | _aEffect of built-in drift fields emmitter recombinations, back surface recombinations and high injection on open circuit voltage decay | |
| 260 | _c1988 | ||
| 650 | _aELECTRICAL ENGINEERING | ||
| 700 | _aUniversity of Delhi. Faculty of Technology. Department of Electrical Engineering | ||
| 942 |
_cDIS _2CC |
||
| 999 |
_c861374 _d861374 |
||