Normal view MARC view ISBD view

Measurement technology: for micro-nanometer devices

Zahang Wendong

Measurement technology: for micro-nanometer devices - Singapore John wiley & sons 2016 - xii,329p. ill. cm

Includes bibliographical references; Index 327-329p.

ISBN: 9781118717967 (hbk)

Standard No.: 197167

Source: 4139, 09/03/2017, Ashutosh Technical Books Textual

Dewey Class. No.: C21:(D), Q7

Place hold
Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)