Measurement technology: for micro-nanometer devices

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TextLanguage: English Publication details: Singapore John wiley & sons 2016Description: xii,329p. ill. cmISBN:

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Textual

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Textual	Central Science Library	Central Science Library			C21:(D) Q7 (Browse shelf(Opens below))					Available			SL1601208

Includes bibliographical references; Index 327-329p.

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