Entry Personal Name

Number of records used in: 1

001 - CONTROL NUMBER

• control field: 1187832

003 - CONTROL NUMBER IDENTIFIER

• control field: OSt

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20260324132039.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 260324|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

• Original cataloging agency: OSt
• Transcribing agency: OSt

100 ## - HEADING--PERSONAL NAME

• Personal name: David R. Medeiros; Michael T. Postek; Hal Kusunose; Takayoshi Matsuyama; A. Meyyappan; Min Bai; Sergey Babin; Andreas Erdmann; Ray J. Hoobler; Christian Kalus; Kurt R. Kimmel; Randall Lee; Vladimir Liberman; Wilhelm Maurer; S. Muckenhirn; James Potzick; Masatoshi Oda; C. Grant Willson; P.J.M. van Adrichem; Joerg Butschke; Shirley Hemar; Frank-Michael Kamm; Florian Letzkus; Hans Loeschner; Franklin Schellenberg; Yoshio Nishi; Michael T. Takac; Shane R. Palmer; Syed Rizvi; Hisatake Sano; R. Lal Tummala; Christer Rydberg; Anja Rosenbusch; Norio Saitou; Pei-yang Yan; Yung-Tsai Yen; Andrew G. Zanzal; Axel Zibold; Nobuyuki Yoshioka; Ebru Apak; Makato Yonezawa; Michael Lercel; R. Fabian Pease; Dachen Chu; Benjamen M. Rathsack

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (OSt)1785528: David R. Medeiros; Michael T. Postek; Hal Kusunose; Takayoshi Matsuyama; A. Meyyappan; Min Bai; Sergey Babin; Andreas Erdmann; Ray J. Hoobler; Christian Kalus; Kurt R. Kimmel; Randall Lee; Vladimir Liberman; Wilhelm Maurer; S. Muckenhirn; James Potzick; Masatoshi Oda; C. Grant Willson; P.J.M. van Adrichem; Joerg Butschke; Shirley Hemar; Frank-Michael Kamm; Florian Letzkus; Hans Loeschner; Franklin Schellenberg; Yoshio Nishi; Michael T. Takac; Shane R. Palmer; Syed Rizvi; Hisatake Sano; R. Lal Tummala; Christer Rydberg; Anja Rosenbusch; Norio Saitou; Pei-yang Yan; Yung-Tsai Yen; Andrew G. Zanzal; Axel Zibold; Nobuyuki Yoshioka; Ebru Apak; Makato Yonezawa; Michael Lercel; R. Fabian Pease; Dachen Chu; Benjamen M. Rathsack, Handbook of Photomask Manufacturing Technology