VLSI test principles and architecture design for testability.

By: Contributor(s): Material type: TextLanguage: English Publication details: Amsterdam Morgan Kaufmann 2006Description: xxiii,777p cmSubject(s): DDC classification:
  • D651:81, P6
Item type: Textual
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Cover image Item type Current library Home library Collection Shelving location Call number Materials specified Vol info URL Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Textual South Campus Library South Campus Library D651:81 P6 (Browse shelf(Opens below)) Available SC1303272

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